Journal of Micro-Nanopatterning Materials and Metrology-JM3
- Title
- Journal of Micro-Nanopatterning Materials and Metrology-JM3
- ISSN
- 1932-5150
- EISSN
- 2708-8340
- Publisher
- SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
- Language
- English
- Database
-
Web of Science (SCIE)
Research Area
| Name(En) | Name(Zh) | XinRui Ranking | Top |
|---|---|---|---|
| Physics and Astronomy | 物理与天体物理 | T 3 | — |
JCR Category
| Name(En) | Name(Zh) | XinRui Ranking |
|---|---|---|
| ENGINEERING, ELECTRICAL & ELECTRONIC | 工程：电子与电气 | T 4 |
| NANOSCIENCE & NANOTECHNOLOGY | 纳米科技 | T 4 |
| MATERIALS SCIENCE, MULTIDISCIPLINARY | 材料科学：综合 | T 4 |
| OPTICS | 光学 | T 4 |